VLSI Test Principles and Architectures: Design for Testability (Hardcover) - Wang, Laung-terng (EDT)/ Cheng, Kwang-Ting (EDT)/ Chang, Yao-Wen (EDT)

No.273

VLSI Test Principles and Architectures: Design for Testability (Hardcover) - Wang, Laung-terng (EDT)/ Cheng, Kwang-Ting (EDT)/ Chang, Yao-Wen (EDT)

저자 : Wang, Laung-terng (EDT)/ Cheng, Kwang-Ting (EDT)/ Chang, Yao-Wen (EDT)

ISBN : 9780123705976

출판사 : Morgan Kaufmann Publishers

출판일 : 20060721

요약

THIS BOOK IS A COMPREHENSIVE GUIDE TO NEW DFT METHODS THAT WILL SHOW THE READERS HOW TO DESIGN A TESTABLE AND QUALITY PRODUCT, DRIVE DOWN TEST COST, IMPROVE PRODUCT QUALITY AND YIELD, AND SPEED UP TIME

-TO

-MARKET AND TIME

-TO

-VOLUME.

MOST UP

-TO

-DATE COVERAGE OF DESIGN FOR...

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time

-to

-market and time

-to

-volume.

Most up

-to

-date coverage of design for testability.

Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.

Numerous, pra...

우표를 생각해보라. 그것의 유용성은 어딘가에 도달할 때까지 어떤 한 가지에 들러붙어 있는 데 있다. - 조시 빌링스 -

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VLSI Test Principles and Architectures: Design for Testability (Hardcover) - Wang, Laung-terng (EDT)/ Cheng, Kwang-Ting (EDT)/ Chang, Yao-Wen (EDT)

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