VLSI Test Principles and Architectures: Design for Testability (Hardcover) - Wang, Laung-terng (EDT)/ Cheng, Kwang-Ting (EDT)/ Chang, Yao-Wen (EDT)
No.273 VLSI Test Principles and Architectures: Design for Testability (Hardcover) - Wang, Laung-terng (EDT)/ Cheng, Kwang-Ting (EDT)/ Chang, Yao-Wen (EDT) 저자 : Wang, Laung-terng (EDT)/ Cheng, Kwang-Ting (EDT)/ Chang, Yao-Wen (EDT) ISBN : 9780123705976 출판사 : Morgan Kaufmann Publishers 출판일 : 20060721 요약THIS BOOK IS A COMPREHENSIVE GUIDE TO NEW DFT METHODS THAT WILL SHOW THE READERS HOW TO DESIGN ..
컴퓨터
2020. 5. 14. 14:02
